Scanning
Electron Microscope
High
performance scanning electron microscope with improved electron optical system
and better solution can help users ¡°see¡¯ more details of their samples.
Specifications:
l Resolution
3.0
nm guaranteed (Tungsten filaments)
l Magnification
6 x ~300,000
x
l Electron
optical system
Electron
gun: openable forked tungsten cathode
Accelerating
voltage: 0 ~30 Kv
Lens
system: three electron magnetic lens system
Objective
lens aperture: three apertures selectable
l Specimen
chamber
Eight
ports for EBSD, WDS, EDS, BSE detectors and other attachment installation
l Specimen
stage
Movable
range: X=80mm, Y=60mm, Z = 50mm, T =tilt -50 ~+900, R=3600 continuous rotation
l Computer
system
PC,
Microsoft operation system
l Image
Display
Digital
image, LCD viewing monitor
l Scanning
mode
Plane,
line and spot scan. Dual magnification
l Operate
and control system
Brand
new designed operation software, SEM control by using keyboard and mouse only,
with assistant operation of manual control box. Versatile automatic function.
Parameters of SEM operation can be stored and easily managed.
l Image
processing and analysis
Image
enhancement, threshold transformation, particle statistic analysis, morphology
transformation, gray level histogram display and pseudo-color transform for
gray scale image.
l Image
output and record
Versatile
image document formats, support digital monochrome printer and versatile
print-out equipment with standard interface.
l Vacuum
system
Fully
automatic diffusion pump vacuum system (turbo molecular pump optional)
